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Scanning electron microscope JSM-IT810 Schottky Field Emission

Scanning electron microscope JSM-IT810 Schottky Field Emission

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  • Brand: JEOL
  • Product Code:JSM-IT810
  • Availability:Pre-Order

Scanning electron microscope JSM-IT810 Schottky Field Emission is available from LABERA.UZ for laboratory, testing, medical and industrial applications in Uzbekistan.

Contact LABERA.UZ for specifications, pricing, lead time and a commercial quotation.

Technical Specifications
Sample Chondras in Julesberg chondrite (L3.6) Tension on the ground: 5 kV
Automatic SEM setup package (optional) This function uses a special sample to calibrate the magnification, beam alignment, and EDS energy calibration. Regular inspections ensure optimal condition of the equipment.

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