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Multibeam system FIB-SEM JIB-PS500i is available from LABERA.UZ for laboratory, testing, medical and industrial applications in Uzbekistan.
Contact LABERA.UZ for specifications, pricing, lead time and a commercial quotation.
| Technical Specifications | |
| Sample | Copper coating (top) Automatic preparation of sample block, (bottom) Thinning of sample unit by automatic processing Surveillance conditions: Accelerating voltage 30 kV, SED detector (SIM image) | Semiconductor device. Observation conditions: Accelerating voltage 3 kV, Detector: SED. Image in secondary electrons. The sample block (200 × 4 × 15 μm). The sample block was obtained using OmniProbe 400*. |