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Atomic resolution analytical electron microscope JEM-ARM200F NEOARM

Atomic resolution analytical electron microscope JEM-ARM200F NEOARM

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  • Brand: JEOL
  • Product Code:JEM-ARM200F
  • Availability:Pre-Order

Atomic resolution analytical electron microscope JEM-ARM200F NEOARM is available from LABERA.UZ for laboratory, testing, medical and industrial applications in Uzbekistan.

Contact LABERA.UZ for specifications, pricing, lead time and a commercial quotation.

Technical Specifications
GaN [211] 200 kV
Si [110] 80 kV
Graphene (monolayer) 30 In
Sample Si[110] Accelerating voltage: 200 kV

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